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| ㆍ작성일 |
2003-02-10 |
| ㆍ첨부#2 |
 1044845544.gif
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| ㆍ응용분야 | 전기전자, 기계, 화학 |
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ㆍ추천: 0 ㆍ조회: 950  
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PICO-AMP Wafer Protrusion Detection
A wafer protruding from a cassette can be broken or damaged. This decreases the throughput and can interrupt a process. The MD14BB6 amplifier, used in conjunction with the SP8ER1 remote sensors, offer a very small sensor with a small (1.5 mm) effective beam. The maximum opposed range is 300 mm (12").
Objective:
To detect when a wafer is protruding from a wafer cassette
Sensor Models:
SP8ER1, MD14BB6 amplifier
자료출처 : BANNER
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| 번호 |
 |
글 제 목 |
응용분야 |
작성일 |
조회 |
|
244 |
|
 PresencePLUS Pro Part Orientation Verification
|
전기전자, 기계, 화학
|
2003-02-12
|
759
|
|
|
243 |
|
PresencePLUS Pro Multiple Component Location
|
전기전자, 기계, 화학
|
2003-02-12
|
712
|
|
|
242 |
|
PresencePLUS Pro Label Positioning
|
전기전자, 기계, 화학
|
2003-02-11
|
728
|
|
|
241 |
|
PresencePLUS Pro Gap (Pitch) Measurement
|
전기전자, 기계, 화학
|
2003-02-11
|
771
|
|
|
240 |
|
PresencePLUS Pro Date/Lot Code Verification
|
전기전자, 기계, 화학
|
2003-02-11
|
732
|
|
|
239 |
|
PresencePLUS Pro Complete Blister Package Verification
|
전기전자, 기계, 화학
|
2003-02-11
|
810
|
|
|
238 |
|
PresencePLUS Missing Bottle Label Detection
|
전기전자, 기계, 화학
|
2003-02-11
|
845
|
|
|
237 |
|
PresencePLUS Gear Curing Verification
|
전기전자, 기계, 화학
|
2003-02-11
|
717
|
|
|
236 |
|
PicoDot Wafer Mapping in FOUP
|
전기전자, 기계, 화학
|
2003-02-10
|
1886
|
|
|
235 |
|
PicoDot Wafer Flat Finder
|
전기전자, 기계, 화학
|
2003-02-10
|
1712
|
|
|
234 |
|
PICO-AMP Wafer Protrusion Detection
|
전기전자, 기계, 화학
|
2003-02-10
|
950
|
|
11
|
|
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